Discover open access scientific publications

Search, annotate, share and cite publications

Publications by Jerry Hunter

Metrology Aspects of SIMS Depth Profiling for Advanced ULSI Processes

1998English

Related publications

Applications of a Novel FIB-SIMS Instrument in SIMS Image Depth Profiling

Microscopy and Microanalysis
Instrumentation
2002English

ToF-SIMS Depth Profiling of a Complex Polymeric Coating Employing a C60 Sputter Source

Surface and Interface Analysis
SurfacesCondensed Matter PhysicsInterfacesMaterials ChemistryFilmsCoatingsChemistry
2007English

ToF-SIMS Depth Profiling of Cells:z-Correction, 3D Imaging, and Sputter Rate of Individual NIH/3T3 Fibroblasts

Analytical Chemistry
Analytical Chemistry
2012English

Deep Sub-Wavelength Metrology for Advanced Defect Classification

2017English

Real Metrology by Using Depth Map Information

2004English

Advanced Metrology for Nanoelectronics at the National Institute of Standards and Technology

2009English

High Depth Resolution Auger Depth Profiling Analysis Using Inclined Holder

Microscopy and Microanalysis
Instrumentation
2010English

Numerical Simulation for ULSI Manufacturing Process

Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
Mechanical Engineering
2008English

Strong-Field Photoionization of Sputtered Neutral Molecules for Molecular Depth Profiling†

Journal of Physical Chemistry C
SurfacesEnergyNanoscienceTheoretical ChemistryOpticalMagnetic MaterialsFilmsNanotechnologyElectronicCoatingsPhysical
2009English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy