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Publications by Jesús J. Ojeda
Determining the Order of Deposition of Natural Latent Fingerprints and Laser Printed Ink Using Chemical Mapping With Secondary Ion Mass Spectrometry
Science and Justice - Journal of the Forensic Science Society
Forensic Medicine
Pathology
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Determination of the Deposition Order of Overlapping Latent Fingerprints and Inks Using Secondary Ion Mass Spectrometry
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Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
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Secondary Ion Mass Spectrometry (SIMS)
Zairyo to Kankyo/ Corrosion Engineering
Surfaces
Alloys
Metals
Materials Chemistry
Electrochemistry
Films
Coatings
Secondary Ion Mass Spectrometry (SIMS)
Depth Profiling of Trace Constituents Using Secondary Ion Mass-Spectrometry
Journal of Research of the National Bureau of Standards
Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities
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Identification and Imaging of Modern Paints Using Secondary Ion Mass Spectrometry With MeV Ions
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
High Energy Physics
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Chemical Imaging of Buried Interfaces in OrganicInorganic Devices Using Focused Ion Beam-Time-Of-Flight-Secondary-Ion Mass Spectrometry
Enhanced Imaging of Developed Fingerprints Using Mass Spectrometry Imaging
Analyst, The
Biochemistry
Environmental Chemistry
Analytical Chemistry
Electrochemistry
Spectroscopy