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Publications by Johannes von Borany
Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope
Microscopy and Microanalysis
Instrumentation
Related publications
Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
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Gridless Ion Acceleration Systems for Time-Of-Flight Mass Spectrometry
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Ion Storage Techniques and Time-Of-Flight Mass Spectrometry in Physical Forensic Science
Towards Secondary Ion Mass Spectrometry on the Helium Ion Microscope: An Experimental and Simulation Based Feasibility Study With He+ and Ne+ Bombardment
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Astronomy
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Selective Reagent Ion-Time of Flight-Mass Spectrometry Study of Six Common Monoterpenes
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Feasibility of Ultra-Performance Liquid Chromatography–ion Mobility–time-Of-Flight Mass Spectrometry in Analyzing Oxysterols
Journal of Chromatography A
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Writing Nanometer-Scale Pits in Sputtered Carbon Films Using the Scanning Tunneling Microscope
Applied Physics Letters
Astronomy
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Chemical Imaging of Buried Interfaces in OrganicInorganic Devices Using Focused Ion Beam-Time-Of-Flight-Secondary-Ion Mass Spectrometry
Atom Probe Field Ion Microscope Study of the Range and Diffusivity of Helium in Tungsten
