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Publications by John Ekerdt
Recent Studies of Oxide-Semiconductor Heterostructures Using Aberration-Corrected Scanning Transmission Electron Microscopy
Journal of Materials Research
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Related publications
Efficient Elastic Imaging of Single Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Depth Sectioning of Individual Dopant Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy
Applied Physics Letters
Astronomy
Physics
Direct Visualization of Magnetic Skyrmion by Aberration-Corrected Differential Phase Contrast Scanning Transmission Electron Microscopy
Application of Aberration-Corrected Transmission Electron Microscopy to Materials Science
Microscopy and Microanalysis
Instrumentation
Imaging ZnO Nanobelts and Nanobelt Supported Metal Nanocatalysts by Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Scanning Transmission Electron Microscopy: The Major Beneficiary of Aberration Correction?
Microscopy and Microanalysis
Instrumentation
Structure and Composition Analysis of Core-Shell Structure Bimetallic Concave Nanocubes by Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Aberration Corrected Photoemission Electron Microscopy With Photonics Applications
