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Publications by Jonathan England
Characterization of Arsenic Plasma Doping and Postimplant Processing of Silicon Using Medium Energy Ion Scattering
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
Use of TRIDYN and Medium Energy Ion Scattering to Calibrate an Industrial Arsenic Plasma Doping Process
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
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Composition Profiles of InAs–GaAs Quantum Dots Determined by Medium-Energy Ion Scattering
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Characterization of Aperiodic and Periodic Thin Cu Films Formed on the Five-Fold Surface Ofi−Al70Pd21Mn9using Medium-Energy Ion Scattering Spectroscopy
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Atomic Scale Simulations of Arsenic Ion Implantation and Annealing in Silicon
Materials Research Society Symposium - Proceedings
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Condensed Matter Physics
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Forefront of Advanced Plasma-Ion Processing
Journal of the Vacuum Society of Japan
Surfaces
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Materials Science
Fabrication and Characterization of Polymeric Optical Waveguides Using Standard Silicon Processing Technology
Heavy Arsenic Doping of Silicon Grown by Atmospheric Pressure Selective Epitaxial Chemical Vapor Deposition
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Materials Science