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Publications by Joydeep Mitra
A Fast Simulation Framework for Full-Chip Thermo-Mechanical Stress and Reliability Analysis of Through-Silicon-Via Based 3D ICs
Identification of N-Glycosylation Sites With Sequence and Structural Features Employing Random Forests
Lecture Notes in Computer Science
Computer Science
Theoretical Computer Science
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IEEE Transactions on Electron Devices
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Experimental Stress Characterization and Numerical Simulation for Copper Pumping Analysis of Through-Silicon Vias
IEEE Transactions on Components, Packaging and Manufacturing Technology
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Manufacturing Engineering
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KLauS – A Charge Readout and Fast Discrimination Chip for Silicon Photomultipliers
Journal of Instrumentation
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Stress Analysis for Cylinder Made of FGM and Subjected to Thermo-Mechanical Loadings
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Analysis of Parallelization Efficiency of Coupled Thermo-Hydro-Mechanical Simulation
Journal of Environmental Science for Sustainable Society
Multi-Functional Interconnect Co-Optimization for Fast and Reliable 3D Stacked ICs
Signal Integrity Analysis in Carbon Nanotube Based Through-Silicon Via
Active and Passive Electronic Components
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3D Convolutional GAN for Fast Simulation
EPJ Web of Conferences
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X-Ray Nanodiffraction Analysis of Stress Oscillations in a W Thin Film on Through-Silicon Via
Journal of Applied Crystallography
Biochemistry
Genetics
Molecular Biology