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Publications by K. Kakushima

XPS Study of the Bonding Properties of Lanthanum Oxide/Silicon Interface With a Trace Amount of Nitrogen Incorporation

Journal of the Electrochemical Society

Condensed Matter Physics

Electrochemistry

Materials Chemistry

Magnetic Materials

Renewable Energy

the Environment

English

Related publications

XPS Study of Sol–gel Produced Lanthanum Oxide Thin Films

Lithuanian Journal of Physics

English

Impurity Incorporation During Rf Sputtering of Silicon Oxide Layers

Physica Status Solidi (a)

English

The Impact of Organic Contamination on the Oxide-Silicon Interface

English

Semiconductor Heterojunction Electrode IV. An XPS/AES Study to Iron-Oxide-Coated Amorphous Silicon

Denki Kagaku oyobi Kogyo Butsuri Kagaku

English

Growth of Aluminum Oxide on Silicon Carbide With an Atomically Sharp Interface

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Condensed Matter Physics

English

Recent Progress in Understanding the Properties of the Amorphous Silicon/Crystalline Silicon Interface

Physica Status Solidi (A) Applications and Materials Science

Electronic Engineering

Condensed Matter Physics

Materials Chemistry

Magnetic Materials

English

Effect of Cadmium Incorporation on the Properties of Zinc Oxide Thin Films

Applied Nanoscience (Switzerland)

Electronic Engineering

Materials Science

Molecular Physics,

Theoretical Chemistry

English

Effects of Nitrogen Incorporation on Structural and Optical Properties of GaNAsP Nanowires

Journal of Physical Chemistry C

Theoretical Chemistry

Magnetic Materials

English

Modulating the Photocatalytic Activity of TiO2 (P25) With Lanthanum and Graphene Oxide

Journal of Photochemistry and Photobiology A: Chemistry

Chemical Engineering

English