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Publications by K. Moller

Cross-Sectional Transmission Electron Microscopy Analysis of {311} Defects From Si Implantation Into Silicon

Applied Physics Letters
AstronomyPhysics
1998English

Guidelines for Managing Acute Bacterial Meningitis

BMJ
2000English

Related publications

Structural Investigation of keV Ar-Ion-Induced Surface Ripples in Si by Cross-Sectional Transmission Electron Microscopy

Physical Review B
2003English

Cross-Sectional Examination of Crystallinity of Carbon Fibers by Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2002English

Analysis of a Wafer Bonded Ge∕Si Heterojunction by Transmission Electron Microscopy

Applied Physics Letters
AstronomyPhysics
2007English

Analysis of Crystal Defects by Scanning Transmission Electron Microscopy (STEM) in a Modern Scanning Electron Microscope

Advanced Structural and Chemical Imaging
Nuclear MedicineRadiologyChemical EngineeringSpectroscopyImaging
2019English

Nitridation Mechanism of Si Compacts Studied by Transmission Electron Microscopy

Materials Transactions, JIM
1996English

Transmission Electron Microscopy

Springer Series in Optical Sciences
OpticalElectronicMagnetic Materials
2008English

Identification of the Character of Crystal Lattice Defects by Transmission Electron Microscopy

Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan
AlloysCondensed Matter PhysicsMetalsTheoretical ChemistryMaterials ChemistryPhysical
1972English

Analysis of Nanostructures With Scanning Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2003English

Analytical Transmission Electron Microscopy

Reviews in Mineralogy and Geochemistry
PetrologyGeochemistry
2014English

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