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Publications by K.-M. H. Lenssen
Exchange Biasing by Ir19Mn81: Dependence on Temperature, Microstructure and Antiferromagnetic Layer Thickness
Journal of Applied Physics
Astronomy
Physics
Related publications
Layer Thickness Dependence of the Exchange-Coupling Field in Annealed Spin-Valve Films.
Journal of the Magnetics Society of Japan
Exchange-Biasing Topological Charges by Antiferromagnetism
Nature Communications
Astronomy
Genetics
Molecular Biology
Biochemistry
Chemistry
Physics
Microstructure and Mechanical Properties of Physical Vapor Deposited Cu/W Nanoscale Multilayers: Influence of Layer Thickness and Temperature
Thin Solid Films
Surfaces
Alloys
Optical
Interfaces
Metals
Materials Chemistry
Magnetic Materials
Films
Coatings
Electronic
Dependence of SPT Head Field Strength on Soft-Under Layer Thickness
Journal of the Magnetics Society of Japan
Thickness Dependence of Microstructure of Laterally Crystallized Poly-Si Thin Films and Electrical Characteristics of Low-Temperature Poly-Si TFTs
Journal of the Electrochemical Society
Surfaces
Condensed Matter Physics
Optical
Electrochemistry
Sustainability
Materials Chemistry
Magnetic Materials
Renewable Energy
Films
Coatings
Electronic
the Environment
Thickness Dependence of Microstructure in Semiconducting Films of an Oligofluorene Derivative
On the Temperature Dependence of the Double Layer Capacitance of Ionic Liquids
Journal of Electroanalytical Chemistry
Analytical Chemistry
Chemical Engineering
Electrochemistry
Exchange Bias, Training Effect, Hysteretic Behavior of Angular Dependence, and Rotational Hysteresis Loss in NiFe/FeMn Bilayer: Effect of Antiferromagnet Layer Thickness
Journal of Applied Physics
Astronomy
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The Antiferromagnetic Structures of IrMn3 and Their Influence on Exchange-Bias
Scientific Reports
Multidisciplinary
