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Publications by Kazuhisa TAKETOSHI

Development of an Electron Diffractometer Using an Electron-Bombarded Amplified MOS Imager.

English

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An Analysis of Fixed Pattern Noise (FPN) for the Amplified MOS Intelligent Imager

The Journal of the Institute of Television Engineers of Japan

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Wettability of Electron Bombarded Teflon

The Journal of the Society of Chemical Industry, Japan

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Electron Ptychography Using an Ultrafast Direct Electron Detector

Microscopy and Microanalysis

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Proposal for an Electron Accelerator Using an Optical Maser

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Generating High Quality Ultrarelativistic Electron Beams Using an Evolving Electron Beam Driver

Physical Review Accelerators and Beams

High Energy Physics

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Development of an 0.2eV Energy Resolution Analytical Electron Microscope

Microscopy and Microanalysis

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Erratum To: Bound State of an Electron in a MOS Structure Due to the Spin–Orbit Interaction

Journal of Experimental and Theoretical Physics

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Developing a High-Resolution X-Ray Imager Using Electron-Multiplying (EM) CCDs

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SEM Image Observation Using an Electron Energy and Electron Take-Off Angle Filtered Detector

Microscopy and Microanalysis

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English