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Publications by Keigo NAGAO
Pole Figure and Residual Stress Measurement of Thin Film Materials by X-Ray Diffraction Method Using a Two-Dimensional Detector
Journal of The Surface Finishing Society of Japan
The Recent Progress of X-Ray Diffractometer
Journal of The Adhesion Society of Japan
Related publications
X-Ray Residual Stress Measurement of Silicon Nitride by Gaussian Curve Method.
Transactions of the Japan Society of Mechanical Engineers Series A
Measurement of Residual Stress Induced by Laser Irradiation on Grain Oriented Silicon Steel Using X-Ray Diffraction
Zairyo/Journal of the Society of Materials Science, Japan
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Integration Techniques for Surface X-Ray Diffraction Data Obtained With a Two-Dimensional Detector
Journal of Applied Crystallography
Biochemistry
Genetics
Molecular Biology
Both Surface Inequi-Thickness Removal - Both Surface X-Ray Diffraction Method for Residual Stress Measurement in a Plate.
Transactions of the Japan Society of Mechanical Engineers Series A
Modeling and Simulation of X-Ray Stress Measurement Using PSPC as a Detector
Zairyo/Journal of the Society of Materials Science, Japan
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Both Surface Inequi-Thickness Removal-Both Surface X-Ray Diffraction Method for Residual Stress Measurement in a Plate
Bulletin of the JSME
Engineering
Residual Stress Measurement by Neutron Diffraction
RADIOISOTOPES
On the Measurement of Residual Stress in Heat Treated Steel by X-Ray Method
Zairyo/Journal of the Society of Materials Science, Japan
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
In-Situ Observation of 2-Dimensional X-Ray Diffraction of Organic Thin-Film Growth by Synchrotron Radiation
Hyomen Kagaku