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Publications by Ken-ichi Yamashita
SEM Image Observation Using an Electron Energy and Electron Take-Off Angle Filtered Detector
Microscopy and Microanalysis
Instrumentation
Study of SEM Images Obtained With an Electron Energy and Take-Off Angle (E-Θ) Selective Detector
Microscopy and Microanalysis
Instrumentation
Related publications
Inelastic Electron Scattering Observation Using Energy Filtered Transmission Electron Microscopy for Silicon-Germanium Nanostructures Imaging.
Microscopy and Microanalysis
Instrumentation
Electron Ptychography Using an Ultrafast Direct Electron Detector
Microscopy and Microanalysis
Instrumentation
Energy Filtered X-Ray Photoemission Electron Microscopy
Advances in Imaging and Electron Physics
High Energy Physics
Electronic Engineering
Electrical
Condensed Matter Physics
Nuclear
Energy-Filtered Electron Diffuse Scattering of Ferroelectrics PMN and PMN-xPT
Acta Crystallographica Section A: Foundations and Advances
Materials Science
Condensed Matter Physics
Theoretical Chemistry
Biochemistry
Structural Biology
Inorganic Chemistry
Physical
Quantitative Energy-Filtered Electron Microscopy of Biological Molecules in Ice
Ultramicroscopy
Instrumentation
Optics
Molecular Physics,
Optical
Atomic
Magnetic Materials
Electronic
meV Resolution in Laser-Assisted Energy-Filtered Transmission Electron Microscopy
Electron and Photon Energy Measurement Calibration With the ATLAS Detector
Optimization of Incident Electron Energy for Internal-Detector Electron Holography With Monte Carlo Simulation
e-Journal of Surface Science and Nanotechnology
Surfaces
Mechanics of Materials
Condensed Matter Physics
Interfaces
Nanoscience
Bioengineering
Films
Biotechnology
Coatings
Nanotechnology
