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Publications by Kenji HINO

In-Situ Analysis of Perfluoro Compounds in Semiconductor Process Exhaust by Ion Attachment Mass Spectrometry (IAMS).

SHINKU
2002English

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Easily Fabricated Ion Source for Characterizing Mixtures of Organic Compounds by Direct Analysis in Real Time Mass Spectrometry

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Mass Spectrometry of Volatile Organic Compounds as Biomarkers in Breath Analysis

Journal of the Mass Spectrometry Society of Japan
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Characterization of Organic Tin Compounds by Mass Spectrometry.

NIPPON KAGAKU KAISHI
1986English

Quantitative Analysis of Zn-Fe Alloy Galvanized Layer by Secondary Ion Mass Spectrometry

Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan
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1986English

Polymerization in Situ Accompanying Field Desorption Mass Spectrometry

Canadian Journal of Chemistry
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1975English

Analysis of Long-Chain Fatty Acyl Coenzyme a Thioesters by Negative Ion Fast-Atom Bombardment Mass Spectrometry and Tandem Mass Spectrometry

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1994English

Secondary Ion Mass Spectrometry (SIMS)

Zairyo to Kankyo/ Corrosion Engineering
SurfacesAlloysMetalsMaterials ChemistryElectrochemistryFilmsCoatings
1993English

Vacuum In-Situ Process for Semiconductor Materials and Devices.

SHINKU
1992English

Development of Lithium Attachment Mass Spectrometry – Knudsen Effusion and Chemical Ionisation Mass Spectrometry (KEMS, CIMS)

Analyst, The
BiochemistryEnvironmental ChemistryAnalytical ChemistryElectrochemistrySpectroscopy
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