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Publications by Kenji NAKAHIRA

Image Restoration and Minute Defects Detection Technique Using Ultrasonic Image for Highly Integrated Electronic Devices

Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
Mechanical Engineering
2017English

Super-Resolution Technique for SEM Image of Semiconductor Device in Consideration of Plural Factors of Brightness Fluctuation

Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
Mechanical Engineering
2013English

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