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Publications by Krishna Kanth Neelisetty
Electron Beam Effects on Silicon Oxide Films – Structure and Electrical Properties
Microscopy and Microanalysis
Instrumentation
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Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
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Effect of Electron Beam Injection on Boron Redistribution in Silicon and Oxide Layer
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Interfacial Electrical Properties of Ion-Beam Sputter Deposited Amorphous Carbon on Silicon
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Substrate Temperature and Electron Fluence Effects on Metallic Films Created by Electron Beam Induced Deposition
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Structure and Substructure Properties of Magnesium Oxide Thin Films
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