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Publications by Kunitaka SATO

Development of an Electron Diffractometer Using an Electron-Bombarded Amplified MOS Imager.

English

Related publications

An Analysis of Fixed Pattern Noise (FPN) for the Amplified MOS Intelligent Imager

The Journal of the Institute of Television Engineers of Japan

English

Wettability of Electron Bombarded Teflon

The Journal of the Society of Chemical Industry, Japan

English

Electron Ptychography Using an Ultrafast Direct Electron Detector

Microscopy and Microanalysis

Instrumentation

English

Proposal for an Electron Accelerator Using an Optical Maser

English

Generating High Quality Ultrarelativistic Electron Beams Using an Evolving Electron Beam Driver

Physical Review Accelerators and Beams

High Energy Physics

English

Development of an 0.2eV Energy Resolution Analytical Electron Microscope

Microscopy and Microanalysis

Instrumentation

English

Erratum To: Bound State of an Electron in a MOS Structure Due to the Spin–Orbit Interaction

Journal of Experimental and Theoretical Physics

English

Developing a High-Resolution X-Ray Imager Using Electron-Multiplying (EM) CCDs

English

SEM Image Observation Using an Electron Energy and Electron Take-Off Angle Filtered Detector

Microscopy and Microanalysis

Instrumentation

English