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Publications by L. A. Giannuzzi
Issues Affecting Quantitative Evaluation of Dopant Profiles Using Electron Holography
Microscopy and Microanalysis
Instrumentation
FIB Damage in Silicon: Amorphization or Redeposition?
Microscopy and Microanalysis
Instrumentation
Related publications
Quantitative Dopant Profiling of P-N Junction in InGaAs∕AlGaAs Light-Emitting Diode Using Off-Axis Electron Holography
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
Mapping of Process Induced Dopant Redistributions by Electron Holography
Microscopy and Microanalysis
Instrumentation
Observation of Dopant Concentration in GaN Semiconductor by High Sensitivity Electron Holography
Materia Japan
Quantitative Examination of Reverse-Biased Semiconductor Devices Using Off- Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Evaluation of Magnetic Properties Through 180° Domain Wall Thickness Measurement Using Electron Holography
Materia Japan
Low Voltage Electron Holography - High Voltage Electron Holography
Microscopy and Microanalysis
Instrumentation
Electron Holography on Fraunhofer Diffraction Using Double Slit
Microscopy and Microanalysis
Instrumentation
Ferroelectric Electron Holography
Microscopy and Microanalysis
Instrumentation
Quantitative Magnetic Imaging of Skyrmions and Magnetic Thin Layers by Lorentz Transmission Electron Microscopy and Electron Holography
Microscopy and Microanalysis
Instrumentation
