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Publications by L. Chekour
Characterization of Nitride Thin Films Using SEM and EDX
Acta Physica Polonica A
Astronomy
Physics
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Structural and Optical Characterization of Pure Si-Rich Nitride Thin Films
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Scratch-Profiles Study in Thin Films Using SEM and EDS
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Polarity Inversion of Aluminum Nitride Thin Films by Using Si and MgSi Dopants
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Characterization of Dentifrices Containing Desensitizing Agents, Triclosan or Whitening Agents: EDX and SEM Analysis
Brazilian Dental Journal
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Preparation of Boron Nitride Thin Films by Using Plasma Chemical Transport of Boron.
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Enhanced EDX Images by Fusion of Multimodal SEM Images Using Pansharpening Techniques
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Compositional Analysis of Silicon Oxide/Silicon Nitride Thin Films
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