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Publications by Lan-Hsuan Lee
A Plan-View TEM Specimen Preparation Method Using Focused Ion Beam
Microscopy and Microanalysis
Instrumentation
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A Sample Preparation Method for Paper Cross-Sections Using a Focused Ion Beam.
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Development of a New Focused Ion Beam Preparation Method of Thin Film for TEM With FIB: A Method Capable of Re-Thinning After TEM Observation
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Focused Ion Beam Based Sample Preparation Techniques
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Site-Specific TEM Specimen Preparation of Grain Boundary Corrosion in Nickel- Based Alloys Using the FIB “Plan-View Lift-Out” Technique
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Marriage of Focused and Broad Ion Beam: Sample Preparation Optimized for High Performance Analytical (S)TEM
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Focused Ion Beam Preparation Techniques for EFTEM Analysis
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Focused Ion Beam: Much More Than a Sample Preparation Tool
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Optimized Ordered Nanoprinting Using Focused Ion Beam
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Comparison of Fib Tem Specimen Preparation Methods
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