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Publications by Laurent Leyssenne
Reliability Analysis of BiCMOS SiGe:C Technology Under Aggressive Conditions for Emerging RF and Mm-Wave Applications: Proposal of Reliability-Aware Circuit Design Methodology
International Journal of Microwave and Wireless Technologies
Electronic Engineering
Electrical
Related publications
Computer Aided Circuit Reliability Analysis
Microelectronics Reliability
Surfaces
Electronic Engineering
Condensed Matter Physics
Electronic
Molecular Physics,
Nanoscience
Films
Optical
Electrical
Atomic
Magnetic Materials
Nanotechnology
Reliability
Safety
Coatings
Optics
Quality
Risk
An Efficient Reliability Simulation Tool for Lifetime-Aware Analog Circuit Synthesis
Turkish Journal of Electrical Engineering and Computer Sciences
Electronic Engineering
Electrical
Computer Science
RF-MEMS Reconfigurable GaAs MMICs and Antennas for Microwave/MM-wave Applications
Circuit Reliability Analysis Using Symbolic Techniques
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Electrical
Software
Computer Graphics
Computer-Aided Design
Electronic Engineering
A Framework for Reliability-Aware Design Exploration on MPSoC Based Systems
Design Automation for Embedded Systems
Hardware
Architecture
Software
Resonance Lens Antenna Analysis for Mm-Wave Applications
Recent Research and Emerging Challenges in Physical Design for Manufacturability/Reliability
Bridge Scour Reliability Under Changing Environmental Conditions
Flicker Noise Comparison of Direct Conversion Mixers Using Schottky and HBT Dioderings in SiGe:C BiCMOS Technology
