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Publications by Len Trombetta
Reduction in Susceptibility of MOS Devices to Radiation- And Electrically-Induced Defects
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Annealing of Radiation-Induced Defects in Polycrystalline Bismuth
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Characterization and Modeling of Mismatch in MOS Devices and Application to Precision Analog Design.
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Surface Transport Studies for MOS Devices.
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Degradation of Hard MOS Devices at Low Temperature
Journal de Physique IV (Proceedings)
