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Publications by Libor Strakos
Non-Destructive Characterization of Extended Crystalline Defects in Confined Semiconductor Device Structures
Nanoscale
Materials Science
Nanotechnology
Nanoscience
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Non-Destructive Characterization of Nitrogen-Implanted Silicon-On-Insulator Structures by Spectroscopic Ellipsometry
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Non-Destructive Characterization of Stony Meteorites
Atom-Probe Tomography of Semiconductor Materials and Device Structures
MRS Bulletin
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Non-Equilibrium Green’s Functions in Semiconductor Device Modeling
Non-Destructive Characterization of Superionic Conductor: Lithium Nitride
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Non-Destructive Test of Steel Structures by Conical Indentation
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Crystalline Characterization of TlBr Semiconductor Detectors Using Wavelength-Resolved Neutron Imaging
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Elements of Structures and Defects of Crystalline Materials by Tsang-Tse Fang
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Non-Destructive Method for Rapid "In Situ" Characterization of Rocks
Bulletin of the Geological Society of Greece
