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Publications by M H Manghnani
The FIB/SEM Technique, Atomic Force Microscopy and Acoustic Microscopy for Detection of Subsurface Defects in Thin DLC Coatings
Microscopy and Microanalysis
Instrumentation
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Modeling the Effect of Subsurface Interface Defects on Contact Stiffness for Ultrasonic Atomic Force Microscopy
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Noninvasive Subcellular Imaging Using Atomic Force Acoustic Microscopy (AFAM)
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Effect of Tip Geometry on Local Indentation Modulus Measurement via Atomic Force Acoustic Microscopy Technique
Review of Scientific Instruments
Medicine
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Elastic and Nanowearing Properties of SiO2-PMMA and Hybrid Coatings Evaluated by Atomic Force Acoustic Microscopy and Nanoindentation"
Atomic Force Microscopy of Reovirus dsRNA: A Routine Technique for Length Measurements
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Calibration-Independent Atomic Force Microscopy
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Ultrasonic Force Microscopy for Nanometer Resolution Subsurface Imaging
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Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy
