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Publications by M. A. Reshchikov
Determination of the Concentration of Impurities in GaN From Photoluminescence and Secondary-Ion Mass Spectrometry
Scientific Reports
Multidisciplinary
Characterization of Free-Standing Hydride Vapor Phase Epitaxy GaN
Applied Physics Letters
Astronomy
Physics
Related publications
Secondary Ion Mass Spectrometry (SIMS)
Zairyo to Kankyo/ Corrosion Engineering
Surfaces
Alloys
Metals
Materials Chemistry
Electrochemistry
Films
Coatings
Secondary Ion Mass Spectrometry (SIMS)
Determination of the Deposition Order of Overlapping Latent Fingerprints and Inks Using Secondary Ion Mass Spectrometry
Analytical Chemistry
Analytical Chemistry
Determination of Trace Impurities in Tantalum Oxide Films by Inductively Coupled Plasma Mass Spectrometry Combined With Ion Exchange
Analytical Sciences
Analytical Chemistry
Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
Microscopy and Microanalysis
Instrumentation
Iterative Clustering and Classification Analysis of Secondary Ion Mass Spectrometry Images
Microscopy and Microanalysis
Instrumentation
Characterization of Electrodeposited Metal Coatings by Secondary Ion Mass Spectrometry
Surface and Coatings Technology
Surfaces
Condensed Matter Physics
Interfaces
Materials Chemistry
Films
Coatings
Chemistry
Depth Profiling of Trace Constituents Using Secondary Ion Mass-Spectrometry
Journal of Research of the National Bureau of Standards
Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities
Microscopy and Microanalysis
Instrumentation
