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Publications by M. H. van Es

Stability Enhancement of an Atomic Force Microscope for Long-Term Force Measurement Including Cantilever Modification for Whole Cell Deformation

Review of Scientific Instruments

Instrumentation

English

Related publications

Nanoscopic Hardness Measurement by Atomic Force Microscope.

Transactions of the Japan Society of Mechanical Engineers Series A

English

Modal Response and Frequency Shift of the Cantilever in a Noncontact Atomic Force Microscope

Applied Physics Letters

English

Optical Excitation of Atomic Force Microscopy Cantilever for Accurate Spectroscopic Measurements

EPJ Techniques and Instrumentation

English

Noncontact Atomic Force Microscopy. Noncontact Atomic Force Microscope Topography of Adsorbed Organic Molecules.

English

Note: Guaranteed Collocated Multimode Control of an Atomic Force Microscope Cantilever Using On-Chip Piezoelectric Actuation and Sensing

Review of Scientific Instruments

Instrumentation

English

A High-Speed Atomic Force Microscope for Studying Biological Macromolecules

Seibutsu Butsuri

English

An Analytic Model for Accurate Spring Constant Calibration of Rectangular Atomic Force Microscope Cantilevers

Scientific Reports

Multidisciplinary

English

Nanomachining of Fused Quartz Using Atomic Force Microscope

English

A Direct Micropipette-Based Calibration Method for Atomic Force Microscope Cantilevers

Review of Scientific Instruments

Instrumentation

English