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Publications by M. Murugesan
Thinning Process Induced Surface Defects in Ultra-Thin Si Wafer
Metal Micro-Bump Induced Stress in 3d-LSIs _A Micro-Raman Study
10-Μm-Pitch In-Au Microbump Interconnection by Chip Self-Assembly With Excimer Lamp Irradiation for 3D LSI Applications
Towards Detection of Brain Tumor in Electroencephalogram Signals Using Support Vector Machines
International Journal of Computer Theory and Engineering
