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Publications by M. Q. Huang

Influence of Backsurface Argon Bombardment on SiO2–Si Interface Characteristics

Applied Physics Letters

English

Magnetic and Structural Characterization and Ferromagnetic Resonance Study of Thin Film HITPERM Soft Magnetic Materials for Data Storage Applications

Journal of Applied Physics

English

Related publications

Mechanical Stability of Ultrathin Ge∕Si Film on SiO2: The Effect of Si∕SiO2 Interface

Journal of Applied Physics

English

Structures and Electronic States of Si/SiO2 Interface.

English

Study of SiO2/Si Interface by Surface Techniques

English

On the C-Si/SiO2 Interface Recombination Parameters From Photo-Conductance Decay Measurements

Journal of Applied Physics

English

Influence of Nanocrystal Size on Optical Properties of Si Nanocrystals Embedded in SiO2 Synthesized by Si Ion Implantation

Journal of Applied Physics

English

Spatially Resolved Vibrational Electron Energy-Loss Spectroscopy Across an Abrupt SiO2/Si Interface

Microscopy and Microanalysis

Instrumentation

English

Study of High Temperature Reaction Between Ti and SiO2 at Interface in Ti/SiO2/TiSi2/Si System by XPS.

English

Effect of Argon Ion Bombardment on Diffusion Bonding of SUS304L Stainless Steel and Pure Iron.

ISIJ International

Mechanics of Materials

Materials Chemistry

Mechanical Engineering

English

Structure of PbTe(SiO2)/SiO2multilayers Deposited on Si(111)

Journal of Applied Crystallography

Molecular Biology

English