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Publications by M. R. Castell

Mechanism for Secondary Electron Dopant Contrast in the SEM

Journal of Electron Microscopy
2000English

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Considerations for Secondary Electron Imaging of Dielectric Materials in Low- Vacuum and Environmental SEM

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Visualizing Astigmatism in the SEM Electron Probe

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Electron Backscatter Diffraction in the SEM: A Tutorial

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Charge Contrast Imaging of Gibbsite in the Variable Pressure SEM

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Another Way to Implement Diffraction Contrast in SEM

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Mechanism of the Triplet-To-Singlet Upconversion in the Assistant Dopant ACRXTN

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Single-Electron Transport Through Single Dopants in a Dopant-Rich Environment

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