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Publications by M. Roncken

Defect-Oriented Testability for Asynchronous ICs

Proceedings of the IEEE
Electronic EngineeringElectricalComputer Science
1999English

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Investigating the Use of Analysis Contracts to Improve the Testability of Object Oriented Code

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Design for Testability of LSI

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Testability Transformation – Program Transformation to Improve Testability

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Defect Prediction for Object Oriented Software Using Support Vector Based Fuzzy Classification Model

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A Secure Architecture of Design for Testability Structures

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