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Publications by M. Sachdev
Impact of Gate Induced Drain Leakage on Overall Leakage of Submicrometer CMOS VLSI Circuits
IEEE Transactions on Semiconductor Manufacturing
Electronic Engineering
Industrial
Condensed Matter Physics
Manufacturing Engineering
Optical
Electrical
Magnetic Materials
Electronic
A Low-Power Reduced Swing Global Clocking Methodology
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Hardware
Electronic Engineering
Electrical
Architecture
Software
An SRAM Weak Cell Fault Model and a DFT Technique With a Programmable Detection Threshold