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Publications by M.A. Carts
Heavy-Ion Broad-Beam and Microprobe Studies of Single-Event Upsets in 0.20-Μm SiGe Heterojunction Bipolar Transistors and Circuits
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Recent Radiation Damage and Single Event Effect Results for Candidate Spacecraft Electronics
Related publications
Heavy-Ion Induced Single Event Upsets in Advanced 65 Nm Radiation Hardened FPGAs
Electronics (Switzerland)
Control
Electronic Engineering
Signal Processing
Computer Networks
Systems Engineering
Hardware
Communications
Electrical
Architecture
Heterostructure Bipolar Transistors and Integrated Circuits
Proceedings of the IEEE
Electronic Engineering
Electrical
Computer Science
Large Signal Characterization and Modeling of Heterojunction Bipolar Transistors
Heterojunction Transistors: Negative Transconductance Heterojunction Organic Transistors and Their Application to Full‐Swing Ternary Circuits (Adv. Mater. 29/2019)
Advanced Materials
Mechanics of Materials
Materials Science
Nanotechnology
Mechanical Engineering
Nanoscience
Nonlinearities in the Base Emitter Junction of Heterojunction Bipolar Transistors
Measurements and Simulations of Single-Event Upsets in a 28-Nm FPGA
Single-Event Upsets in the Cluster and Double Star Digital Wave Processor Instruments
Space Weather
Atmospheric Science
Analytical and Numerical Studies of Heavy Ion Beam Transport in the Fusion Chamber
Laser and Particle Beams
Electronic Engineering
Condensed Matter Physics
Molecular Physics,
Electrical
Atomic
Optics
SOI Thin Microdosimeters for High LET Single Event Upset Studies in Fe, O, Xe and Cocktail Ion Beam Fields
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
