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Publications by M.J. Pellin
Combining Atom-Probe Tomography and Focused-Ion Beam Microscopy to Study Individual Presolar Meteoritic Nanodiamond Particles
Microscopy and Microanalysis
Instrumentation
Oxygen and Titanium Sputtering Yields as Determined by Laser Fluorescence and Auger Electron Spectroscopy for Monolayer Oxygen Coverage of Polycrystalline Ti
Journal of Nuclear Materials
High Energy Physics
Materials Science
Engineering
Nuclear Energy
Nuclear
Related publications
Focused Ion Beam Tomography
Distinguishing Meteoritic Nanodiamonds From Disordered Carbon Using Atom-Probe Tomography
Microscopy Today
Focused Ion Beam (FIB) Microscopy and Technology
Microscopy and Microanalysis
Instrumentation
An Introduction to Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Three-Dimensional Cathodoluminescence by Focused Ion Beam - Scanning Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Three Dimensional Atom Probe Tomography of Nanoscale Thin Films, Interfaces and Particles
Nano-Scale Characterization of Materials by Atom Probe Field Ion Microscopy.
Bulletin of the Japan Institute of Metals
Probing Catalytic Surfaces by Correlative Scanning Photoemission Electron Microscopy and Atom Probe Tomography
Journal of Materials Chemistry A
Materials Science
Chemistry
the Environment
Sustainability
Renewable Energy
Atom Probe Tomography and Correlative Microscopy: 3D Nanoscale Characterization of Metals, Minerals and Materials
JOM
Materials Science
Engineering
