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Publications by MJ Naughton
Application of Dual Beam FIB to the Metrology of Nanostructured Photovoltaic Devices
Microscopy and Microanalysis
Instrumentation
Related publications
A Microscopic Model for the Behavior of Nanostructured Organic Photovoltaic Devices
Journal of Applied Physics
Astronomy
Physics
FIB Dual-Beam Sample Preparation for TEM Observation
Microscopy and Microanalysis
Instrumentation
EBSD Performed “In-Situ” on a Dual-Beam FIB
Microscopy and Microanalysis
Instrumentation
Serial Sectioning of Deformed Microcrystals Using a Dual-Beam FIB-SEM Microscope
Microscopy and Microanalysis
Instrumentation
Application of Vision Metrology to Tunnel Profile Measurement.
Doboku Gakkai Ronbunshu
Interface Study by Dual-Beam FIB-TEM in a Pressureless Infiltrated Al(Mg)-Al2O3interpenetrating Composite
Journal of Microscopy
Forensic Medicine
Pathology
Histology
Subdiffraction Instrumentation Development and Application to the Elucidation of Biological Systems, Thin Films, and Organic Photovoltaic Devices
The Development of Thermal Coefficients of Photovoltaic Devices
Informacije MIDEM
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
F4TCNQ Doping of P3HT:PCBM Photovoltaic Devices
Journal of Photopolymer Science and Technology
Organic Chemistry
Polymers
Materials Chemistry
Plastics