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Publications by Maarten Bischoff
Chromatic Aberration Correction for Atomic Resolution TEM Imaging From 20 to 80 kV
Physical Review Letters
Astronomy
Physics
Probing the Out-Of-Plane Distortion of Single Point Defects in Atomically Thin Hexagonal Boron Nitride at the Picometer Scale
Physical Review Letters
Astronomy
Physics
Related publications
STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging at ≤ 30 kV With No Aberration Correction for Nanomaterials on Graphene Support
Microscopy and Microanalysis
Instrumentation
Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope
Microscopy and Microanalysis
Instrumentation
Spherical Aberration Correction in TEM
Hyomen Kagaku
Precise Correction of Lateral Chromatic Aberration in Images
Lecture Notes in Computer Science
Computer Science
Theoretical Computer Science
Atomic-Resolution EELS in Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
On Proper Phase Contrast Imaging in Aberration Corrected TEM
Microscopy and Microanalysis
Instrumentation
Atomic Imaging in Aberration-Corrected HRTEM With Application to Al Alloys
Microscopy and Microanalysis
Instrumentation
Chromatic-Aberration-Corrected Diffractive Lenses for Ultra-Broadband Focusing
Scientific Reports
Multidisciplinary
Nanomilling for Aberration – Corrected TEM and HAADF STEM
Microscopy and Microanalysis
Instrumentation