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Publications by Markus Lentzen
Distinct as Snowflakes: The Shapes of Silicon Nanoscale Particles
Microscopy and Microanalysis
Instrumentation
Analysis of Amorphous and Oxide Surface Layers on Nanoparticles
Microscopy and Microanalysis
Instrumentation
Application of Variable CS HRTEM to the Study of Nanoscale Structures
Microscopy and Microanalysis
Instrumentation
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