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Publications by Masaaki FUJII
Development of Source Apportionment of Individual Particle by High Resolution Time of Flight-Secondary Ion Mass Spectrometry
Journal of the Vacuum Society of Japan
Surfaces
Instrumentation
Interfaces
Spectroscopy
Materials Science
High Sensitivity On-Line Monitor for Radioactive Effluent.
Journal of Nuclear Science and Technology
High Energy Physics
Nuclear
Engineering
Nuclear Energy
Related publications
Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
Microscopy and Microanalysis
Instrumentation
Development of Quantitative Techniques With Time-Of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for Li Characterization in High Energy Batteries.
Microscopy and Microanalysis
Instrumentation
Development of Ar Cluster-Ion Beam and Time-Of-Flight Secondary-Ion Mass Spectrometer
Physics and High Technology
Comparison of Submicron Particle Analysis by Auger Electron Spectroscopy, Time‐of‐flight Secondary Ion Mass Spectrometry, and Secondary Electron Microscopy With Energy Dispersive X‐ray Spectroscopy
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Surfaces
Films
Interfaces
Condensed Matter Physics
Coatings
Gridless Ion Acceleration Systems for Time-Of-Flight Mass Spectrometry
Journal of the American Society for Mass Spectrometry
Structural Biology
Spectroscopy
Chemical Imaging of Buried Interfaces in OrganicInorganic Devices Using Focused Ion Beam-Time-Of-Flight-Secondary-Ion Mass Spectrometry
Investigation of Silver Nanoparticle Induced Lipids Changes on a Single Cell Surface by Time-Of-Flight Secondary Ion Mass Spectrometry
Stable Isotope Imaging of Biological Samples With High Resolution Secondary Ion Mass Spectrometry and Complementary Techniques
Methods
Biochemistry
Genetics
Molecular Biology
Selective Reagent Ion-Time of Flight-Mass Spectrometry Study of Six Common Monoterpenes
International Journal of Mass Spectrometry
Instrumentation
Theoretical Chemistry
Condensed Matter Physics
Spectroscopy
Physical
