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Publications by Matty Caymax
Non-Destructive Characterization of Extended Crystalline Defects in Confined Semiconductor Device Structures
Nanoscale
Materials Science
Nanotechnology
Nanoscience
Atomic Layer Deposition of High-K Dielectric Layers on Ge and III-V MOS Channels
Related publications
Non-Destructive Characterization of Nitrogen-Implanted Silicon-On-Insulator Structures by Spectroscopic Ellipsometry
Materials Science & Engineering B: Solid-State Materials for Advanced Technology
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Non-Destructive Characterization of Stony Meteorites
Atom-Probe Tomography of Semiconductor Materials and Device Structures
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
Non-Equilibrium Green’s Functions in Semiconductor Device Modeling
Non-Destructive Characterization of Superionic Conductor: Lithium Nitride
Materials Science-Poland
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Non-Destructive Test of Steel Structures by Conical Indentation
MATEC Web of Conferences
Materials Science
Engineering
Chemistry
Crystalline Characterization of TlBr Semiconductor Detectors Using Wavelength-Resolved Neutron Imaging
Sensors and Materials
Materials Science
Instrumentation
Elements of Structures and Defects of Crystalline Materials by Tsang-Tse Fang
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
Non-Destructive Method for Rapid "In Situ" Characterization of Rocks
Bulletin of the Geological Society of Greece
