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Publications by Mitsuhiro Nogami
Crystalline Characterization of TlBr Semiconductor Detectors Using Wavelength-Resolved Neutron Imaging
Sensors and Materials
Materials Science
Instrumentation
Transient Absorption Spectroscopy of TlBr Crystals Using Pulsed Electron Beams
Sensors and Materials
Materials Science
Instrumentation
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Non-Destructive Characterization of Extended Crystalline Defects in Confined Semiconductor Device Structures
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STUDY AND DEVELOPMENT OF NEUTRON DETECTORS USING DOPED CsI CRYSTALS
Characteristics of TlBr Single Crystals Grown Using the Vertical Bridgman-Stockbarger Method for Semiconductor-Based Radiation Detector Applications
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Laboratory Implementation of Edge Illumination X-Ray Phase-Contrast Imaging With Energy-Resolved Detectors
Photodetection Characterization of SiPM Technologies for Their Application in Scintillator Based Neutron Detectors
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Characterization of Semiconductor Nanowires Using Optical Tweezers
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