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Publications by Motohiro WAKAZONO
A Test Compaction Oriented Don't Care Identification Method Based on X-Bit Distribution
IEICE Transactions on Information and Systems
Electronic Engineering
Pattern Recognition
Hardware
Computer Vision
Electrical
Architecture
Artificial Intelligence
Software
Related publications
A Novel Test Data Compression Approach Based on Bit Reversion
IEICE Electronics Express
Electronic Engineering
Condensed Matter Physics
Optical
Electrical
Magnetic Materials
Electronic
A Test Suite Reduction Method Based on Test Requirement Partition
International Journal of Grid and Distributed Computing
Computer Science
A Low Bit Rate Vocoder Based on an Improved Cepstral Method
Journal of the Acoustical Society of America
Acoustics
Ultrasonics
Arts
Humanities
Privacy Amplification of Content Identification Systems Based on Fingerprint Bit Reliability
Reliability Test Plan Based on Dagum Distribution
International Journal of Advanced Statistics and Probability
What Drivers Don't Know; Or Don't Care
A Quick Test Method Based on Requirements Traceability Matrix
DEStech Transactions on Environment, Energy and Earth Sciences
Statistical Analysis of Improved Bit-Stuffing Method Based on CAN Bus
DEStech Transactions on Computer Science and Engineering
Detection Method for Counterfeit Currency Based on Bit-Plane Slicing Technique
International Journal of Multimedia and Ubiquitous Engineering
Computer Science
