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Publications by N. Berbel

Modelling and Experimental Verification of the Impact of Negative Bias Temperature Instability on CMOS Inverter

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
2009English

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