Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by N. Bosio
Self-Checking Monitor for NBTI Due Degradation
Related publications
Controllable Self-Checking Checkers for Conditional Concurrent Checking
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Electrical
Software
Computer Graphics
Computer-Aided Design
Electronic Engineering
Low Cost NBTI Degradation Detection and Masking Approaches
IEEE Transactions on Computers
Hardware
Architecture
Mathematics
Computational Theory
Theoretical Computer Science
Software
Quantitative Model Checking of Systems With Degradation
New Self-Checking Booth Multipliers
International Journal of Applied Mathematics and Computer Science
Engineering
Computer Science
Applied Mathematics
Self-Checking Current-Mode Analogue Memory
Electronics Letters
Electronic Engineering
Electrical
Pass Transistor Based Self-Checking Full Adder
International Journal of Computer Theory and Engineering
Recovery of CHC- And NBTI-induced Degradation on MOSFETs by Using Different Annealing Treatments
The Critical Current in a NbTi Tape Measured in Different Directions of Magnetic Field and the Current Reduction Due to the Self Field
IEEE Transactions on Magnetics
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Self-Triggered Single Pulse Beam Position Monitor
