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Publications by N. F. Leite
Analysis of Residual Stress in Diamond Films by X-Ray Diffraction and Micro-Raman Spectroscopy
Journal of Applied Physics
Astronomy
Physics
Photoacoustic Investigation of Semiconductors: Influence of Carrier Diffusion and Recombination in PbTe and Si
Physical Review B
Related publications
D-11 Measurement and Modeling of Residual Stresses at Microscopic and Mesoscopic Levels Using Micro Raman Spectroscopy and X-Ray Diffraction
Powder Diffraction
Instrumentation
Radiation
Condensed Matter Physics
Materials Science
In Situ Analysis of Mechanochemical Reactions Using Combined X-Ray Diffraction and Raman Spectroscopy
Acta Crystallographica Section A: Foundations and Advances
Materials Science
Condensed Matter Physics
Theoretical Chemistry
Biochemistry
Structural Biology
Inorganic Chemistry
Physical
Residual Stress Analysis in Laser Welded NiTi Sheets Using Synchrotron X-Ray Diffraction
Materials and Design
Mechanics of Materials
Materials Science
Mechanical Engineering
Raman Spectroscopy and X-Ray Diffraction of Phase Transitions inCr2O3to 61 GPa
Physical Review B
Dislocation Studies in Diamond by X-Ray Diffraction Microscopy
Synthesis and Characterization of Cobalt Ferrite CoxFe3-xO4 Nanoparticles by Raman Spectroscopy and X-Ray Diffraction
International Journal of Metallurgy and Metal Physics
X-Ray Investigation of Fatigue Damage of Metals : On the Changes in Half-Value Breadth of X-Ray Diffraction Line, Residual Stress, Micro-Structrue, and Micro-Hardness Due to Stress Repetitions
Transactions of the Japan Society of Mechanical Engineers
CVD Diamond Films Quality Characterization by ESR, SEM and Raman Spectroscopy
Acta Physica Polonica A
Astronomy
Physics
Diamond Pressure Medium for X-Ray Diffraction
Proceedings of the Japan Academy
