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Publications by Nathan Wang

STEM Scanning Mode Observation of Semiconductor Devices

Microscopy and Microanalysis
Instrumentation
2003English

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Semiconductor Physics and Semiconductor Devices

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Basics of Semiconductor Devices

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Passivation of Semiconductor Devices.

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Physics of Semiconductor Devices

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Observation of Magnetic Domains Using a Reflection-Mode Scanning Near-Field Optical Microscope

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Infrared Semiconductor Devices

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Observation of Cross Sectional Semiconductor Sample With Newly Developed SEI/STEM/TEM Microscope

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I. Semiconductor Optical Devices

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Simulating Nanoscale Semiconductor Devices

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