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Publications by Nenad Novkovski
Peculiarities of the Interface Between High-Permittivity Dielectrics and Semiconductors
Frontiers in Materials
Materials Science
Frequency Dependence of C-V Characteristics of MOS Capacitors Containing Nanosized High-Κ Ta2O5 Dielectrics
Advances in Materials Science and Engineering
Materials Science
Engineering
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Electronic Structure of O-Vacancy in High-K Dielectrics and Oxide Semiconductors
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T-Coercivity for Scalar Interface Problems Between Dielectrics and Metamaterials
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Novel Low-Permittivity Dielectrics for Si-Based Microelectronics
Estimation of the Permittivity of Dielectrics From the Scattering Responses of TEM Waveguides
Mathematical Description of Quantum Tunneling Polarization in Proton Semiconductors and Dielectrics
Proceedings of the Russian higher school Academy of sciences
The Study of the Spectral Relationship of the Dielectric Permittivity of Polar Dielectrics in the Low Frequency Range
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Bonded Interface Between High-Polymer Material and Metal
Materia Japan
