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Publications by Nuriel Amir
Techniques for Improving Overlay Accuracy by Using Device Correlated Metrology Targets as Reference
Journal of Micro/ Nanolithography, MEMS, and MOEMS
Electronic Engineering
Condensed Matter Physics
Mechanical Engineering
Electronic
Molecular Physics,
Nanoscience
Optical
Electrical
Atomic
Magnetic Materials
Nanotechnology
Optics
Related publications
Diffraction Based Overlay Metrology for Double Patterning Technologies
Robust Overlay Metrology With Differential Mueller Matrix Calculus
Optics Express
Optics
Atomic
Molecular Physics,
Improving the Accuracy of Face Detection for Damaged Video and Distant Targets
Predicting New Human Drug Targets by Using Feature Selection Techniques
Improving Classification Accuracy Using Clustering Technique
Bulletin of Electrical Engineering and Informatics
Control
Systems Engineering
Information Systems
Electronic Engineering
Instrumentation
Computer Networks
Hardware
Communications
Optimization
Electrical
Computer Science
Architecture
Improving Classification Accuracy Using Fuzzy Method for BCI Signals
Bio-Medical Materials and Engineering
Medicine
Biomaterials
Biomedical Engineering
High Accuracy Measuring Device for Dental Cast. Using Device With Flat Laser Beam.
Kokubyo Gakkai zasshi. The Journal of the Stomatological Society, Japan
Medicine
Improving Accuracy Using Different Data Mining Algorithms
International Journal of Computer Applications
Improving Accuracy by Leaps and Unbounds
Physics
