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Publications by O. Gluschenkov
Analytical TEM Characterization of Source/Drain Contacts in Advanced Semiconductor Devices
Microscopy and Microanalysis
Instrumentation
Related publications
Source / Drain Contacts in Organic Polymer Thin Film Transistors
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
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Analytical Modelling for P-I-N Structured Semiconductor Devices
AIP Advances
Nanotechnology
Astronomy
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Nanoscience
Metal-Semiconductor Contacts
Characterization of Enhanced Conductivity Dielectrics for Use in Semiconductor Devices.
Issues of Three-Dimensional Nanometer Scale Analysis for Advanced Semiconductor Devices
Vacuum and Surface Science
Avalanche Hot Source Method for Separated Extraction of Parasitic Source and Drain Resistances in Single Metal-Oxide-Semiconductor Field Effect Transistors
Journal of Semiconductor Technology and Science
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Electrical
Magnetic Materials
Electronic
Challenges of Electrical Measurements of Advanced Gate Dielectrics in Metal-Oxide-Semiconductor Devices
AIP Conference Proceedings
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Semiconductor Physics and Semiconductor Devices
The Journal of the Institute of Television Engineers of Japan
In-Situ TEM of Nanoscale ReRAM Devices
Vacuum and Surface Science
