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Publications by O. Oberemok
Borophosphosilicate Glass Component Analysis Using Secondary Neutral Mass Spectrometry
Semiconductor Physics, Quantum Electronics and Optoelectronics
Electronic Engineering
Optics
Molecular Physics,
Optical
Electrical
Atomic
Magnetic Materials
Electronic
Related publications
The Depth Profiling of Glass Surfaces by Mass Spectrometry Using Neutral-Particle Bombardment
Bulletin of the Chemical Society of Japan
Chemistry
Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities
Microscopy and Microanalysis
Instrumentation
Rapid Densification of Borophosphosilicate Glass.
Effects of Ion Optics on the Sensitivity Factors in Secondary Neutral Mass Spectrometry Measurements.
Analytical Sciences
Analytical Chemistry
Secondary Ion Mass Spectrometry (SIMS)
Zairyo to Kankyo/ Corrosion Engineering
Surfaces
Alloys
Metals
Materials Chemistry
Electrochemistry
Films
Coatings
Secondary Ion Mass Spectrometry (SIMS)
Depth Profiling of Trace Constituents Using Secondary Ion Mass-Spectrometry
Journal of Research of the National Bureau of Standards
Iterative Clustering and Classification Analysis of Secondary Ion Mass Spectrometry Images
Microscopy and Microanalysis
Instrumentation
New Approach for Improvement of Secondary Ion Mass Spectrometry Profile Analysis
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
