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Publications by P M Voyles

Medium-Range Order in Amorphous Silicon Measured by Fluctuation Electron Microscopy: Final Report, 23 June 1999--23 August 2002

2003English

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Amorphous Silicon Research. Final Technical Progress Report, 1 August 1994--28 February 1998

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“To Do So Much...” Neil S. Jacobson: 23 February 1949 – 2 June 1999

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