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Publications by P. C. Dorsey

Structural and Magnetic Characterization of Amorphous Gd2Fe14B Thin Films

Journal of Applied Physics
AstronomyPhysics
1993English

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Application of Thin Film Diffractometer to Structural Study of Amorphous Thin Films.

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1989English

Hrem Characterization of Magnetic Thin Films and Multilayers

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Structural Characterization of Thin Films and Multilayer Structures

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Structural Origins of Intrinsic Stress in Amorphous Silicon Thin Films

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