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Publications by P. Cartujo-Cassinello

Role of Surface-Roughness Scattering in Double Gate Silicon-On-Insulator Inversion Layers

Journal of Applied Physics

English

Electron Mobility in Double Gate Silicon on Insulator Transistors: Symmetric-Gate Versus Asymmetric-Gate Configuration

Journal of Applied Physics

English

Surface Roughness at the Si–SiO2 Interfaces in Fully Depleted Silicon-On-Insulator Inversion Layers

Journal of Applied Physics

English

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